Microelectronics failure analysis: lecture series

di Soft Test. New Smyrna Beach, FL, USA, New Mexico Univ. Albuquerque, NM, USA
Pubblicazione 2007

THE 15TH INTERNATIONAL CONFERENCE ON THE DARK SIDE OF THE UNIVERSE

di Pyungwon Ko (KIAS, South Korea), Carlos Muñoz (IFT UAM-CSIC, Spain), Shaaban Khalil (Zewail City of Science and Technology, Egypt), Keith Olive (Minnesota University, USA), Csaba Balazs (Monash University, Australia), David Delepine (Guanajuato University, Mexico), Qaisar Shafi (Delaware University, USA), Yu-Feng Zhou (KITPC/ITP-CAS, China), Christiane Frigerio Martins (Universidade de São Paulo, Brazil), Paolo Salucci (SISSA, Italy), Peter Dunsby (Cape Town University, South Africa), Fumihiro Takayama (YITP, Japan), Joern Kersten (Bergen University, Norway), Yann Mambrini (LPT CNRS-Univ Paris Sud 11, France), Kiwoon Choi (CTPU-IBS, South Korea), Genevieve Belanger (LAPTh-CNRS, France)
Pubblicazione 2019