Depth profiling of Cr-ITO dual-layer sample with secondary ion mass spectrometry using MeV ions in the low energy region

por Barac, Marko, Brajković, Marko, Siketić, Zdravko, Ekar, Jernej, Bogdanović Radović, Iva, Šrut Rakić, Iva, Kovač, Janez
Publicado 2022