Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level

por Arezki, Yassir, Su, Rong, Heikkinen, Ville, Leprete, François, Posta, Pavel, Bitou, Youichi, Schober, Christian, Mehdi-Souzani, Charyar, Alzahrani, Bandar Abdulrahman Mohammed, Zhang, Xiangchao, Kondo, Yohan, Pruss, Christof, Ledl, Vit, Anwer, Nabil, Bouazizi, Mohamed Lamjed, Leach, Richard, Nouira, Hichem
Publicado 2021