An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

por Andany, Santiago H, Hlawacek, Gregor, Hummel, Stefan, Brillard, Charlène, Kangül, Mustafa, Fantner, Georg E
Publicado 2020

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

por Hosseini, Nahid, Neuenschwander, Matthias, Peric, Oliver, Andany, Santiago H, Adams, Jonathan D, Fantner, Georg E
Publicado 2019