Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques

por Gallagher, James C., Ebrish, Mona A., Porter, Matthew A., Jacobs, Alan G., Gunning, Brendan P., Kaplar, Robert J., Hobart, Karl D., Anderson, Travis J.
Publicado 2022

Using machine learning with optical profilometry for GaN wafer screening

por Gallagher, James C., Mastro, Michael A., Ebrish, Mona A., Jacobs, Alan G., Gunning, Brendan P., Kaplar, Robert J., Hobart, Karl D., Anderson, Travis J.
Publicado 2023