An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO(2) Layer

por Zarzycki, Artur, Galeano, July, Bargiel, Sylwester, Andrieux, Aurore, Gorecki, Christophe
Publicado 2019

Optimized ICPCVD-Based TiO(2) for Photonics

por Andrieux, Aurore, Mennemanteuil, Marie-Maxime, Geoffroy, Nicolas, Emo, Mélanie, Markey, Laurent, Hammani, Kamal
Publicado 2022