Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments

por Al Hassan, Ali, Lähnemann, Jonas, Davtyan, Arman, Al-Humaidi, Mahmoud, Herranz, Jesús, Bahrami, Danial, Anjum, Taseer, Bertram, Florian, Dey, Arka Bikash, Geelhaar, Lutz, Pietsch, Ullrich
Publicado 2020

X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

por Davtyan, Arman, Kriegner, Dominik, Holý, Václav, AlHassan, Ali, Lewis, Ryan B., McDermott, Spencer, Geelhaar, Lutz, Bahrami, Danial, Anjum, Taseer, Ren, Zhe, Richter, Carsten, Novikov, Dmitri, Müller, Julian, Butz, Benjamin, Pietsch, Ullrich
Publicado 2020