Structure determination from power diffraction data

por David, William I F, Shankland, Kenneth, McCusker, Lynne B, Baerlocher, Christian
Publicado 2006

Serial snapshot crystallography for materials science with SwissFEL

por Dejoie, Catherine, Smeets, Stef, Baerlocher, Christian, Tamura, Nobumichi, Pattison, Philip, Abela, Rafael, McCusker, Lynne B.
Publicado 2015