Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

por Davtyan, Arman, Lehmann, Sebastian, Kriegner, Dominik, Zamani, Reza R., Dick, Kimberly A., Bahrami, Danial, Al-Hassan, Ali, Leake, Steven J., Pietsch, Ullrich, Holý, Václav
Publicado 2017

Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments

por Al Hassan, Ali, Lähnemann, Jonas, Davtyan, Arman, Al-Humaidi, Mahmoud, Herranz, Jesús, Bahrami, Danial, Anjum, Taseer, Bertram, Florian, Dey, Arka Bikash, Geelhaar, Lutz, Pietsch, Ullrich
Publicado 2020

Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging

por Davtyan, Arman, Krause, Thilo, Kriegner, Dominik, Al-Hassan, Ali, Bahrami, Danial, Mostafavi Kashani, Seyed Mohammad, Lewis, Ryan B., Küpers, Hanno, Tahraoui, Abbes, Geelhaar, Lutz, Hanke, Michael, Leake, Steven John, Loffeld, Otmar, Pietsch, Ullrich
Publicado 2017

X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

por Davtyan, Arman, Kriegner, Dominik, Holý, Václav, AlHassan, Ali, Lewis, Ryan B., McDermott, Spencer, Geelhaar, Lutz, Bahrami, Danial, Anjum, Taseer, Ren, Zhe, Richter, Carsten, Novikov, Dmitri, Müller, Julian, Butz, Benjamin, Pietsch, Ullrich
Publicado 2020