Soft errors in commercial off-the-shelf static random access memories

por Dilillo, L, Tsiligiannis, G, Gupta, V, Bosser, A, Saigne, F, Wrobel, F
Publicado 2017

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

por Bosser, A, Gupta, V, Tsiligiannis, G, Javanainen, A, Kettunen, H, Puchner, H, Saigne, F, Virtanen, A, Wrobel, F, Dilillo, L
Publicado 2015

Heavy-Ion Radiation Impact on a 4Mb FRAM under Different Test Conditions

por Gupta, V., Bosser, A., Tsiligiannis, G., Zadeh, A., Javanainen, A., Virtanen, A., Puchner, H., Saigne, F., Wrobel, F., Dilillo, L.
Publicado 2015

SEE on Different Layers of Stacked-SRAMs

por Gupta, V, Bosser, A, Tsiligiannis, G, Rousselet, M, Mohammadzadeh, A, Javanainen, A, Virtanen, A, Puchner, H, Saigné, F, Wrobel, F, Dilillo, L
Publicado 2015

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

por Bosser, A., Gupta, V., Tsiligiannis, G., Ferraro, R., Frost, C., Javanainen, A., Puchner, H., Rossi, M., Saigne, F., Virtanen, A., Wrobel, F., Zadeh, A., Dilillo, L.
Publicado 2015

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory

por Bosser, A L, Gupta, V, Javanainen, A, Tsiligiannis, G, La Lumondiere, S D, Brewe, D, Ferlet-Cavrois, V, Puchner, H, Kettunen, H, Gil, T, Wrobel, F, Saigné, F, Virtanen, A, Dilillo, L
Publicado 2018