Effects of radiation on MOS structures and silicon devices

por Bräunig, D, Fahrner, W R
Publicado 1983

Electronic components in a high-dose environment

por Wulf, F, Bräunig, D, Boden, A
Publicado 1989

Radiation hardening of VLSI-electronics

por Wulf, F, Bräunig, D, Boden, A
Publicado 1989

Radiation-damage studies, irradiations and high-dose dosimetry for LHC detectors

por Coninckx, F, Heijne, Erik H M, León-Florián, E, Leutz, H, Schönbacher, Helmut, Sonderegger, P, Tavlet, Marc, Sopko, B, Henschel, H, Schmidt, H U, Boden, A, Bräunig, D, Wulf, F, Cramariuc, R, Ilie, D, Fattibene, P, Onori, S, Miljanic, S, Paic, G, Razen, B, Razem, D, Rendic, D
Publicado 1991