Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose

por Nikolaou, Aristeidis, Chevas, Loukas, Papadopoulou, Alexia, Makris, Nikolaos, Bucher, Matthias, Borghello, Giulio, Faccio, Federico
Publicado 2019

The writing’s on the wall for Sherlock

por Ruder, Thomas D, Thali, Yannick, Bucher, Matthias, Cottier, Annie, Thali, Michael J, Hatch, Gary M
Publicado 2011

Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS

por Chevas, Loukas, Nikolaou, Aristeidis, Bucher, Matthias, Makris, Nikolaos, Papadopoulou, Alexia, Zografos, Apostolos, Borghello, Giulio, Koch, Henri D, Faccio, Federico
Publicado 2018

Extending a 65nm CMOS process design kit for high total ionizing dose effects

por Nikolaou, Aristeidis, Bucher, Matthias, Makris, Nikos, Papadopoulou, Alexia, Chevas, Loukas, Borghello, Giulio, Koch, Henri D, Kloukinas, Kostas, Poikela, Tuomas S, Faccio, Federico
Publicado 2018