Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives

por Losurdo, Maria, Bergmair, Michael, Bruno, Giovanni, Cattelan, Denis, Cobet, Christoph, de Martino, Antonello, Fleischer, Karsten, Dohcevic-Mitrovic, Zorana, Esser, Norbert, Galliet, Melanie, Gajic, Rados, Hemzal, Dušan, Hingerl, Kurt, Humlicek, Josef, Ossikovski, Razvigor, Popovic, Zoran V., Saxl, Ottilia
Publicado 2009