Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method †

por Chao, Calvin Yi-Ping, Tu, Honyih, Wu, Thomas Meng-Hsiu, Chou, Kuo-Yu, Yeh, Shang-Fu, Yin, Chin, Lee, Chih-Lin
Publicado 2017

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors †

por Chao, Calvin Yi-Ping, Yeh, Shang-Fu, Wu, Meng-Hsu, Chou, Kuo-Yu, Tu, Honyih, Lee, Chih-Lin, Yin, Chin, Paillet, Philippe, Goiffon, Vincent
Publicado 2019

A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel †

por Takahashi, Seiji, Huang, Yi-Min, Sze, Jhy-Jyi, Wu, Tung-Ting, Guo, Fu-Sheng, Hsu, Wei-Cheng, Tseng, Tung-Hsiung, Liao, King, Kuo, Chin-Chia, Chen, Tzu-Hsiang, Chiang, Wei-Chieh, Chuang, Chun-Hao, Chou, Keng-Yu, Chung, Chi-Hsien, Chou, Kuo-Yu, Tseng, Chien-Hsien, Wang, Chuan-Joung, Yaung, Dun-Nien
Publicado 2017