An Implementation of the Fundamental Parameters Approach for Analysis of X-ray Powder Diffraction Line Profiles

por Mendenhall, Marcus H., Mullen, Katharine, Cline, James P.
Publicado 2015

Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles

por Armstrong, Nicholas, Kalceff, Walter, Cline, James P., Bonevich, John E.
Publicado 2004

The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials

por Cline, James P., Mendenhall, Marcus H., Black, David, Windover, Donald, Henins, Albert
Publicado 2015