Effects of Vacuum Annealing on the Conduction Characteristics of ZnO Nanosheets

por Barnett, Chris J., Smith, Nathan A., Jones, Daniel R., Maffeis, Thierry G. G., Cobley, Richard J.
Publicado 2015

Nondestructive Method for Mapping Metal Contact Diffusion in In(2)O(3) Thin-Film Transistors

por Kryvchenkova, Olga, Abdullah, Isam, Macdonald, John Emyr, Elliott, Martin, Anthopoulos, Thomas D., Lin, Yen-Hung, Igić, Petar, Kalna, Karol, Cobley, Richard J.
Publicado 2016