X-ray Diffraction Imaging of Deformations in Thin Films and Nano-Objects

por Thomas, Olivier, Labat, Stéphane, Cornelius, Thomas, Richard, Marie-Ingrid
Publicado 2022

Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction

por Cornelius, Thomas W., Mocuta, Cristian, Escoubas, Stéphanie, Lima, Luiz R. M., Araújo, Eudes B., Kholkin, Andrei L., Thomas, Olivier
Publicado 2020

In situ bending of an Au nanowire monitored by micro Laue diffraction

por Leclere, Cédric, Cornelius, Thomas W., Ren, Zhe, Davydok, Anton, Micha, Jean-Sébastien, Robach, Odile, Richter, Gunther, Belliard, Laurent, Thomas, Olivier
Publicado 2015

In Situ Nano-Indentation of a Gold Sub-Micrometric Particle Imaged by Multi-Wavelength Bragg Coherent X-ray Diffraction

por Lauraux, Florian, Labat, Stéphane, Richard, Marie-Ingrid, Leake, Steven J., Zhou, Tao, Kovalenko, Oleg, Rabkin, Eugen, Schülli, Tobias U., Thomas, Olivier, Cornelius, Thomas W.
Publicado 2022

Crystallographic Anisotropy Dependence of Interfacial Sliding Phenomenon in a Cu(16)/Nb(16) ARB (Accumulated Rolling Bonding) Nanolaminate

por Sahay, Rahul, Budiman, Arief S., Aziz, Izzat, Navarro, Etienne, Escoubas, Stéphanie, Cornelius, Thomas W., Gunawan, Fergyanto E., Harito, Christian, Lee, Pooi See, Thomas, Olivier, Raghavan, Nagarajan
Publicado 2022

Scanning force microscope for in situ nanofocused X-ray diffraction studies

por Ren, Zhe, Mastropietro, Francesca, Davydok, Anton, Langlais, Simon, Richard, Marie-Ingrid, Furter, Jean-Jacques, Thomas, Olivier, Dupraz, Maxime, Verdier, Marc, Beutier, Guillaume, Boesecke, Peter, Cornelius, Thomas W.
Publicado 2014