Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage

por Rack, Alexander, Scheel, Mario, Danilewsky, Andreas N.
Publicado 2016

Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals

por Gradwohl, Kevin-P., Danilewsky, Andreas N., Roder, Melissa, Schmidbauer, Martin, Janicskó-Csáthy, József, Gybin, Alexander, Abrosimov, Nikolay, Sumathi, R. Radhakrishnan
Publicado 2020

Large-Scale Defect Clusters with Hexagonal Honeycomb-like Arrangement in Ammonothermal GaN Crystals

por Kirste, Lutz, Tran Thi Caliste, Thu Nhi, Weyher, Jan L., Smalc-Koziorowska, Julita, Zajac, Magdalena A., Kucharski, Robert, Sochacki, Tomasz, Grabianska, Karolina, Iwinska, Malgorzata, Detlefs, Carsten, Danilewsky, Andreas N., Bockowski, Michal, Baruchel, José
Publicado 2022