Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

por Muthu, Bharathi Raj, Pushpa, Ewins Pon, Dhandapani, Vaithiyanathan, Jayaraman, Kamala, Vasanthakumar, Hemalatha, Oh, Won-Chun, Sagadevan, Suresh
Publicado 2021