Demonstration of a MOT in a sub-millimeter membrane hole

por Lee, Jongmin, Biedermann, Grant, Mudrick, John, Douglas, Erica A., Jau, Yuan-Yu
Publicado 2021

Degradation Mechanisms for GaN and GaAs High Speed Transistors

por Cheney, David J., Douglas, Erica A., Liu, Lu, Lo, Chien-Fong, Gila, Brent P., Ren, Fan, Pearton, Stephen J.
Publicado 2012