Influence of voids in the hybrid layer based on self-etching adhesive systems: a 3-D FE analysis

por MARTINI, Ana Paula, ANCHIETA, Rodolfo Bruniera, ROCHA, Eduardo Passos, FREITAS, Amilcar Chagas, de ALMEIDA, Erika Oliveira, SUNDFELD, Renato Herman, LUERSEN, Marco Antonio
Publicado 2009