Scanning Electron Microscopy with Samples in an Electric Field

por Frank, Ludĕk, Hovorka, Miloš, Mikmeková, Šárka, Mikmeková, Eliška, Müllerová, Ilona, Pokorná, Zuzana
Publicado 2012

Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

por Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Müllerová, Ilona, Frank, Luděk, Piňos, Jakub, Průcha, Lukáš, Radlička, Tomáš, Werner, Wolfgang S. M., Mikmeková, Eliška Materna
Publicado 2021