Scanning force microscope for in situ nanofocused X-ray diffraction studies

por Ren, Zhe, Mastropietro, Francesca, Davydok, Anton, Langlais, Simon, Richard, Marie-Ingrid, Furter, Jean-Jacques, Thomas, Olivier, Dupraz, Maxime, Verdier, Marc, Beutier, Guillaume, Boesecke, Peter, Cornelius, Thomas W.
Publicado 2014