Free electron laser

por Gaupp, A
Publicado 1995

Efficient high-order suppression system for a metrology beamline

por Sokolov, A., Sertsu, M. G., Gaupp, A., Lüttecke, M., Schäfers, F.
Publicado 2018

The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II

por Schäfers, F., Bischoff, P., Eggenstein, F., Erko, A., Gaupp, A., Künstner, S., Mast, M., Schmidt, J.-S., Senf, F., Siewert, F., Sokolov, A., Zeschke, Th.
Publicado 2016