Electron paramagnetic resonance investigations of isolated impurities and impurity pairs in silicon

por Burchard, A, Gehlhoff, W, Irmscher, K
Publicado 1996

Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon

por Böhrer, J, Burchard, A, Gehlhoff, W
Publicado 1997

Combined electrical, optical and structural investigations of impurities and defects in wide-gap II-VI compounds: addendum to the proposal P35

por Boyn, R, Burchard, A, Gehlhoff, W, Haas, H, Henneberger, F, Kreissl, J, Näser, A, Reinhold, B, Reislöhner, U, Wienecke, M, Witthuhn, W, Wruck, D
Publicado 1998