CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current

por Sacchettini, Yolène, Carrère, Jean-Pierre, Duru, Romain, Oddou, Jean-Pierre, Goiffon, Vincent, Magnan, Pierre
Publicado 2019

Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage

por Le Roch, Alexandre, Goiffon, Vincent, Marcelot, Olivier, Paillet, Philippe, Pace, Federico, Belloir, Jean-Marc, Magnan, Pierre, Virmontois, Cédric
Publicado 2019

Comments by the Editors

por Fleetwood, Dan, Quinn, Heather, Robinson, William, Moss, Steven, Goiffon, Vincent, Paillet, Philippe, Ding, Lili, Loveless, Daniel, Black, Jeffrey, Faccio, Federico, Barth, Janet
Publicado 2023

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors †

por Chao, Calvin Yi-Ping, Yeh, Shang-Fu, Wu, Meng-Hsu, Chou, Kuo-Yu, Tu, Honyih, Lee, Chih-Lin, Yin, Chin, Paillet, Philippe, Goiffon, Vincent
Publicado 2019

Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications

por Durnez, Clémentine, Virmontois, Cédric, Panuel, Pierre, Antonsanti, Aubin, Goiffon, Vincent, Estribeau, Magali, Saint-Pé, Olivier, Lalucaa, Valérian, Berdin, Erick, Larnaudie, Franck, Belloir, Jean-Marc, Codreanu, Catalin, Chavanne, Ludovic
Publicado 2023