Temperature Distribution in TaO(x) Resistive Switching Devices Assessed In Operando by Scanning Thermal Microscopy

por Meng, Jingjia, Goodwill, Jonathan M., Strelcov, Evgheni, Bao, Kefei, McClelland, Jabez J., Skowronski, Marek
Publicado 2023

Spontaneous current constriction in threshold switching devices

por Goodwill, Jonathan M., Ramer, Georg, Li, Dasheng, Hoskins, Brian D., Pavlidis, Georges, McClelland, Jabez J., Centrone, Andrea, Bain, James A., Skowronski, Marek
Publicado 2019