Low Trapping Effects and High Electron Confinement in Short AlN/GaN-On-SiC HEMTs by Means of a Thin AlGaN Back Barrier

por Harrouche, Kathia, Venkatachalam, Srisaran, Ben-Hammou, Lyes, Grandpierron, François, Okada, Etienne, Medjdoub, Farid
Publicado 2023