Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects

por Bang, Minji, Ha, Jonghyeon, Lee, Gyeongyeop, Suh, Minki, Kim, Jungsik
Publicado 2023

Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors

por Lee, Gyeongyeop, Ha, Jonghyeon, Kim, Kihyun, Bae, Hagyoul, Kim, Chong-Eun, Kim, Jungsik
Publicado 2022

On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET

por Ha, Jonghyeon, Lee, Gyeongyeop, Bae, Hagyoul, Kim, Kihyun, Han, Jin-Woo, Kim, Jungsik
Publicado 2022