Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting Material

por Hari, Sangeetha, Trompenaars, P. H. F., Mulders, J. J. L., Kruit, Pieter, Hagen, C. W.
Publicado 2020

Current-biased superconducting strips as position sensitive particle detectors

por Scherschel, M A, Maier, T, Zhao Shu Ping, Hagen, C W, Juanos-Sole, E, Lerch, P, Zehnder, A, Ott, H R
Publicado 1994

Electron-beam patterned calibration structures for structured illumination microscopy

por Hari, Sangeetha, Slotman, Johan A., Vos, Yoram, Floris, Christian, van Cappellen, Wiggert A., Hagen, C. W., Stallinga, Sjoerd, Houtsmuller, Adriaan B., Hoogenboom, Jacob P.
Publicado 2022