Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy

por Dominiczak, Maguy, Otubo, Larissa, Alamarguy, David, Houzé, Frédéric, Volz, Sebastian, Noël, Sophie, Bai, Jinbo
Publicado 2011

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

por Piquemal, François, Kaja, Khaled, Chrétien, Pascal, Morán-Meza, José, Houzé, Frédéric, Ulysse, Christian, Harouri, Abdelmounaim
Publicado 2023

High Piezoelectric Conversion Properties of Axial InGaN/GaN Nanowires

por Jegenyes, Nikoletta, Morassi, Martina, Chrétien, Pascal, Travers, Laurent, Lu, Lu, Julien, Francois H., Tchernycheva, Maria, Houzé, Frédéric, Gogneau, Noelle
Publicado 2018