Genome-wide association study for grain yield and related traits in elite wheat varieties and advanced lines using SNP markers

por Wang, Sheng-Xing, Zhu, Yu-Lei, Zhang, De-Xin, Shao, Hui, Liu, Peng, Hu, Jian-Bang, Zhang, Heng, Zhang, Hai-Ping, Chang, Cheng, Lu, Jie, Xia, Xian-Chun, Sun, Gen-Lou, Ma, Chuan-Xi
Publicado 2017