Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

por Croshaw, Jeremiah, Dienel, Thomas, Huff, Taleana, Wolkow, Robert
Publicado 2020

Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface

por Labidi, Hatem, Koleini, Mohammad, Huff, Taleana, Salomons, Mark, Cloutier, Martin, Pitters, Jason, Wolkow, Robert A.
Publicado 2017

Lithography for robust and editable atomic-scale silicon devices and memories

por Achal, Roshan, Rashidi, Mohammad, Croshaw, Jeremiah, Churchill, David, Taucer, Marco, Huff, Taleana, Cloutier, Martin, Pitters, Jason, Wolkow, Robert A.
Publicado 2018