So, You Want to Have a Nanofab? Shared-Use Nanofabrication and Characterization Facilities: Cost-of-Ownership, Toolset, Utilization, and Lessons Learned

por Liddle, J. Alexander, Bowser, Jerry, Ilic, B. Robert, Luciani, Vincent
Publicado 2020

Accurate localization microscopy by intrinsic aberration calibration

por Copeland, Craig R., McGray, Craig D., Ilic, B. Robert, Geist, Jon, Stavis, Samuel M.
Publicado 2021

Subnanometer localization accuracy in widefield optical microscopy

por Copeland, Craig R., Geist, Jon, McGray, Craig D., Aksyuk, Vladimir A., Liddle, J. Alexander, Ilic, B. Robert, Stavis, Samuel M.
Publicado 2018

Unmasking the Resolution–Throughput Tradespace of Focused-Ion-Beam Machining

por Madison, Andrew C., Villarrubia, John S., Liao, Kuo-Tang, Copeland, Craig R., Schumacher, Joshua, Siebein, Kerry, Ilic, B. Robert, Liddle, J. Alexander, Stavis, Samuel M.
Publicado 2022

Rapid Prototyping of Nanofluidic Slits in a Silicone Bilayer

por Kole, Thomas P., Liao, Kuo-Tang, Schiffels, Daniel, Ilic, B. Robert, Strychalski, Elizabeth A., Kralj, Jason G., Liddle, J. Alexander, Dritschilo, Anatoly, Stavis, Samuel M.
Publicado 2015