High-Energy Proton and Atmospheric-Neutron Irradiations of SiC Power MOSFETs: SEB Study and Impact on Channel and Drift Resistances

por Martinella, C, Race, S, Stark, R, Alia, R G, Javanainen, A, Grossner, U
Publicado 2023

Current Transport Mechanism for Heavy-Ion Degraded SiC MOSFETs

por Martinella, C, Stark, R, Ziemann, T, Alia, R G, Kadi, Y, Grossner, U, Javanainen, A
Publicado 2019

Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs

por Martinella, C, Ziemann, T, Stark, R, Tsibizov, A, Voss, K O, Alia, R G, Kadi, Y, Grossner, U, Javanainen, A
Publicado 2020

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

por Bosser, A, Gupta, V, Tsiligiannis, G, Javanainen, A, Kettunen, H, Puchner, H, Saigne, F, Virtanen, A, Wrobel, F, Dilillo, L
Publicado 2015

Heavy-Ion Radiation Impact on a 4Mb FRAM under Different Test Conditions

por Gupta, V., Bosser, A., Tsiligiannis, G., Zadeh, A., Javanainen, A., Virtanen, A., Puchner, H., Saigne, F., Wrobel, F., Dilillo, L.
Publicado 2015

Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies

por Martinella, C, Alia, R G, Stark, R, Coronetti, A, Cazzaniga, C, Kastriotou, M, Kadi, Y, Gaillard, R, Grossner, U, Javanainen, A
Publicado 2021

SEE on Different Layers of Stacked-SRAMs

por Gupta, V, Bosser, A, Tsiligiannis, G, Rousselet, M, Mohammadzadeh, A, Javanainen, A, Virtanen, A, Puchner, H, Saigné, F, Wrobel, F, Dilillo, L
Publicado 2015

Heavy-ion induced single event effects and latent damages in SiC power MOSFETs

por Martinella, C, Natzke, P, Alia, R G, Kadi, Y, Niskanen, K, Rossi, M, Jaatinen, J, Kettunen, H, Tsibizov, A, Grossner, U, Javanainen, A
Publicado 2022

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

por Bosser, A., Gupta, V., Tsiligiannis, G., Ferraro, R., Frost, C., Javanainen, A., Puchner, H., Rossi, M., Saigne, F., Virtanen, A., Wrobel, F., Zadeh, A., Dilillo, L.
Publicado 2015

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory

por Bosser, A L, Gupta, V, Javanainen, A, Tsiligiannis, G, La Lumondiere, S D, Brewe, D, Ferlet-Cavrois, V, Puchner, H, Kettunen, H, Gil, T, Wrobel, F, Saigné, F, Virtanen, A, Dilillo, L
Publicado 2018