Direct measurement of nanoscale filamentary hot spots in resistive memory devices

por Deshmukh, Sanchit, Rojo, Miguel Muñoz, Yalon, Eilam, Vaziri, Sam, Koroglu, Cagil, Islam, Raisul, Iglesias, Ricardo A., Saraswat, Krishna, Pop, Eric
Publicado 2022

Nanoscale temperature sensing of electronic devices with calibrated scanning thermal microscopy

por Swoboda, Timm, Wainstein, Nicolás, Deshmukh, Sanchit, Köroğlu, Çağıl, Gao, Xing, Lanza, Mario, Hilgenkamp, Hans, Pop, Eric, Yalon, Eilam, Muñoz Rojo, Miguel
Publicado 2023

Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO(2) Resistive Random Access Memories to Address Device Variability

por Swoboda, Timm, Gao, Xing, Rosário, Carlos M. M., Hui, Fei, Zhu, Kaichen, Yuan, Yue, Deshmukh, Sanchit, Köroǧlu, Çaǧıl, Pop, Eric, Lanza, Mario, Hilgenkamp, Hans, Rojo, Miguel Muñoz
Publicado 2023