X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulses

por Kaganer, Vladimir M., Petrov, Ilia, Samoylova, Liubov
Publicado 2020

Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus silicon

por Kaganer, Vladimir M., Petrov, Ilia, Samoylova, Liubov
Publicado 2021

Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod’s law

por Kaganer, Vladimir M., Konovalov, Oleg V., Fernández-Garrido, Sergio
Publicado 2021

Delayed crystallization of ultrathin Gd(2)O(3 )layers on Si(111) observed by in situ X-ray diffraction

por Hanke, Michael, Kaganer, Vladimir M, Bierwagen, Oliver, Niehle, Michael, Trampert, Achim
Publicado 2012

Cross-sectional shape evolution of GaN nanowires during molecular beam epitaxy growth on Si(111)

por Volkov, Roman, Borgardt, Nikolai I., Konovalov, Oleg V., Fernández-Garrido, Sergio, Brandt, Oliver, Kaganer, Vladimir M.
Publicado 2021

X-ray scattering study of GaN nanowires grown on Ti/Al(2)O(3) by molecular beam epitaxy

por Kaganer, Vladimir M., Konovalov, Oleg V., Calabrese, Gabriele, van Treeck, David, Kwasniewski, Albert, Richter, Carsten, Fernández-Garrido, Sergio, Brandt, Oliver
Publicado 2023