Quantitatively estimating defects in graphene devices using discharge current analysis method

por Jung, Ukjin, Lee, Young Gon, Kang, Chang Goo, Lee, Sangchul, Kim, Jin Ju, Hwang, Hyeon June, Lim, Sung Kwan, Ham, Moon-Ho, Lee, Byoung Hun
Publicado 2014

Charge-transfer-based Gas Sensing Using Atomic-layer MoS(2)

por Cho, Byungjin, Hahm, Myung Gwan, Choi, Minseok, Yoon, Jongwon, Kim, Ah Ra, Lee, Young-Joo, Park, Sung-Gyu, Kwon, Jung-Dae, Kim, Chang Su, Song, Myungkwan, Jeong, Yongsoo, Nam, Kee-Seok, Lee, Sangchul, Yoo, Tae Jin, Kang, Chang Goo, Lee, Byoung Hun, Ko, Heung Cho, Ajayan, Pulickel M., Kim, Dong-Ho
Publicado 2015