Radiation damage in single-particle cryo-electron microscopy: effects of dose and dose rate

por Karuppasamy, Manikandan, Karimi Nejadasl, Fatemeh, Vulovic, Milos, Koster, Abraham J., Ravelli, Raimond B. G.
Publicado 2011

Non-rigid image registration to reduce beam-induced blurring of cryo-electron microscopy images

por Karimi Nejadasl, Fatemeh, Karuppasamy, Manikandan, Newman, Emily R., McGeehan, John E., Ravelli, Raimond B. G.
Publicado 2013