Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry

por Kenaz, Ralfy, Ghosh, Saptarshi, Ramachandran, Pradheesh, Watanabe, Kenji, Taniguchi, Takashi, Steinberg, Hadar, Rapaport, Ronen
Publicado 2023