Polarization-sensitive intensity diffraction tomography

por Song, Seungri, Kim, Jeongsoo, Moon, Taegyun, Seong, Baekcheon, Kim, Woovin, Yoo, Chang-Hyuk, Choi, Jun-Kyu, Joo, Chulmin
Publicado 2023

E2E-BPF microscope: extended depth-of-field microscopy using learning-based implementation of binary phase filter and image deconvolution

por Seong, Baekcheon, Kim, Woovin, Kim, Younghun, Hyun, Kyung-A, Jung, Hyo-Il, Lee, Jong-Seok, Yoo, Jeonghoon, Joo, Chulmin
Publicado 2023