Dielectric and electrical properties of annealed ZnS thin films. The appearance of the OLPT conduction mechanism in chalcogenides

por Koaib, J., Bouguila, N., Abassi, H., Moutia, N., Kraini, M., Timoumi, A., Vázquez-Vázquez, C., Khirouni, K., Alaya, S.
Publicado 2020