Radiation hardness studies of a 130 nm Silicon Germanium BiCMOS technology with a dedicated ASIC

por Díez, S, Wilder, M, Ullán, M, Tazawa, Y, Sutton, A K, Spieler, H, Spencer, E, Seiden, A, Sadrozinski, H F W, Ruat, M, Rescia, S, Phillips, S, Newcomer, F M, Mayers, G, Martinez-McKinney, F, Mandić, I, Kononenko, W, Grillo, A A, Emerson, V, Dressnandt, N, Cressler, J D
Publicado 2009