Low‐energy electron microscopy intensity–voltage data – Factorization, sparse sampling and classification

por Masia, Francesco, Langbein, Wolfgang, Fischer, Simon, Krisponeit, Jon‐Olaf, Falta, Jens
Publicado 2022

The morphology of VO(2)/TiO(2)(001): terraces, facets, and cracks

por Krisponeit, Jon-Olaf, Fischer, Simon, Esser, Sven, Moshnyaga, Vasily, Schmidt, Thomas, Piper, Louis F. J., Flege, Jan Ingo, Falta, Jens
Publicado 2020