Nondestructive Method for Mapping Metal Contact Diffusion in In(2)O(3) Thin-Film Transistors

por Kryvchenkova, Olga, Abdullah, Isam, Macdonald, John Emyr, Elliott, Martin, Anthopoulos, Thomas D., Lin, Yen-Hung, Igić, Petar, Kalna, Karol, Cobley, Richard J.
Publicado 2016