Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi(2)Se(3) Thin Films

por Gracia-Abad, Rubén, Sangiao, Soraya, Kumar Chaluvadi, Sandeep, Orgiani, Pasquale, Teresa, José María De
Publicado 2023

Omnipresence of Weak Antilocalization (WAL) in Bi(2)Se(3) Thin Films: A Review on Its Origin

por Gracia-Abad, Rubén, Sangiao, Soraya, Bigi, Chiara, Kumar Chaluvadi, Sandeep, Orgiani, Pasquale, De Teresa, José María
Publicado 2021