Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

por Dresselhaus-Marais, Leora E., Kozioziemski, Bernard, Holstad, Theodor S., Ræder, Trygve Magnus, Seaberg, Matthew, Nam, Daewoong, Kim, Sangsoo, Breckling, Sean, Choi, Sungwook, Chollet, Matthieu, Cook, Philip K., Folsom, Eric, Galtier, Eric, Gonzalez, Arnulfo, Gorkhover, Tais, Guillet, Serge, Haldrup, Kristoffer, Howard, Marylesa, Katagiri, Kento, Kim, Seonghan, Kim, Sunam, Kim, Sungwon, Kim, Hyunjung, Knudsen, Erik Bergbäck, Kuschel, Stephan, Lee, Hae Ja, Lin, Chuanlong, McWilliams, R. Stewart, Nagler, Bob, Nielsen, Martin Meedom, Ozaki, Norimasa, Pal, Dayeeta, Pablo Pedro, Ricardo, Saunders, Alison M., Schoofs, Frank, Sekine, Toshimori, Simons, Hugh, van Driel, Tim, Wang, Bihan, Yang, Wenge, Yildirim, Can, Poulsen, Henning Friis, Eggert, Jon H.
Publicado 2023