Enhanced reliability of phase-change memory via modulation of local structure and chemical bonding by incorporating carbon in Ge(2)Sb(2)Te(5)

por Han, Jeong Hwa, Jeong, Hun, Park, Hanjin, Kwon, Hoedon, Kim, Dasol, Lim, Donghyeok, Baik, Seung Jae, Kwon, Young-Kyun, Cho, Mann-Ho
Publicado 2021