Photo reflectivity and photo electron yield from technical surfaces

por Liedl, A, Angelucci, M, La Francesca, E, Schäfers, F, Sertsu, M G, Siewert, F, Sokolov, A, Cimino, R
Publicado 2020

Reflectivity and photoelectron yield from copper in accelerators

por La Francesca, E, Angelucci, M, Liedl, A, Spallino, L, Gonzalez, L A, Bellafont, I, Siewert, F, Sertsu, M G, Sokolov, A, Schäfers, F, Cimino, R
Publicado 2020