Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

por Tsoutsouva, M. G., Oliveira, V. A., Baruchel, J., Camel, D., Marie, B., Lafford, T. A.
Publicado 2015

Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications

por Tran Thi, Thu Nhi, Morse, J., Caliste, D., Fernandez, B., Eon, D., Härtwig, J., Barbay, C., Mer-Calfati, C., Tranchant, N., Arnault, J. C., Lafford, T. A., Baruchel, J.
Publicado 2017